Streamline Your X-Ray/CT processes, Increase Your Throughput, and Improve Your Bottom Line! – 103112 – Missed our Webinar? Watch it here…

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For more on X-Ray and CT technology Click here!

Streamline your x-ray inspection process with Nikon technology!

This informative webinar is next week! Don’t miss out! Register today to learn how to streamline your X-Ray/CT processes, increase your throughput, improve your bottom line, all this and more with the unique XT H 450 Micro-Focus X-Ray and CT from Nikon!

Wednesday, October 31st at 1:00pm (est).

Nikon Metrology Celebrates Grand Opening of Newly Renovated Technology Center

BRIGHTON, MI. – October 18, 2011 – Nikon Metrology. Inc. (NMI) – More than 100 Metrology and Manufacturing Professionals gathered to visit the new Nikon Metrology, Inc. Technology Center, located at their Headquarters for the Americas in Brighton, Michigan.  The purpose of the event was to introduce one of the most advanced technology centers in Livingston County, Michigan, a sentiment echoed by Brighton Mayor Ricci Bandkau, who was on-hand to cut the ribbon, opening the Technology Center.  Also present was Gary Vasilash, Editor-in-Chief of Automotive Design and Production, who keynoted with a state of the Automotive Industry.  The Theme of “Advances in Industrial Metrology” was evident in the number of new and updated products on display.  These included the HN-6060, Nikon Metrology’s leading Multi-Sensor Metrology System; BW-H501 3D Surface Profiler; MMDx Laser Scanners featuring increased speed of operation; and the ShuttlePix portable, digital Microscope, among many others.  Product demonstrations and Technology overviews were held throughout the day, along with customer presentations from Arizona State University and Joe Gibbs Racing.

Also on display was a range of products highlighting:

Traditional measuring systems
Bridge CMM
Horizontal arm CMM
Articulated arms
Optical CMMs
Camio software
CMM-Manager

Large scale metrology
Laser Radar
iSpace /iGPS
Gantry CMM

Laser scanning
CMM scanning
Handheld scanning
Walkaround scanning
Robotized scanning
Pointcloud software

X-ray /CT
Electronics X-ray inspection
Computed Tomography
CT inspection of turbine blades

Vision based systems
Industrial Microscopes
Measuring microscopes
Scanning electron microscopes
CNC Vision systems
Semiconductor inspection
Optical comparators
Autocollimators
Digital height gages
Vision measuring software

For more information, please visit http://www.nikonmetrology.com or call 810-220-4360.

Nikon Metrology Exhibits at Semicon West 2011

     

 

 

 

 

 

When you visit Semicon West this year, be sure to stop by Nikon Metrology’s booth, #6146, and see the best that metrology has to offer.  You’ll be glad you did.  Featured products include: 

Nexiv VMA

NeoScope

L200N

X-Ray / CT Inspection

ShuttlePix

 

We hope to see you at the show!

Contact us today to set up a demo at the show.

Click here for your complimentary registration to SEMICON West 2011!  

Philips Lighting Turnhout pushes innovation using Nikon Metrology X-ray and CT

Radiography imaging and metrology drives research, quality, productivity and a reduced ecological footprint

Philips Lighting in Turnhout, Belgium, recently took delivery of a Nikon Metrology XT V system for X-ray and computer tomography (CT) inspection. Engineers investigate electrodes and other parts of high-intensity discharge (HID) lamp prototypes, to push the boundaries of lamp performance, lifespan and ecological material usage. They inspect lamps from every angle, and repeat the inspections on the same units after extended lighting periods. Deeper insight into the progression of glass corrosion, component wear and deposit formation allows Philips Lighting to reduce extensive life testing, thus saving tremendously on energy cost.

A tradition of X-ray inspection carried forward

The Philips Lighting business division produces billions of bulbs a year. Philips Lighting kicked off X-ray inspection in 2003 to support the design-through-manufacturing process of high-intensity discharge (HID) lamps. The multinational’s division in Turnhout, Belgium, manufactures long-lasting HID lamps from 20 to 4000 Watt offering high light output and premium light quality. These innovative illumination solutions raise comfort standards in offices, public buildings and factory halls; enhance traffic safety through street lights and passenger car headlights; and add entertainment value with splashing light shows toning up rock stars’ performances.

Philips lighting decided to make X-ray and CT an integral part of its internal processes.

X-ray helps Philips Lighting to successfully respond to the tight electrode requirements imposed on HID lamp engineering.

“There is no doubt that X-ray inspection presents the best strategy to study the feasibility of new technologies, assemblies and materials and maintain high production quality,” says Chris Dries from Philips Innovative Applications in Turnhout. “For this reason we decided to further increase and sharpen our non-destructive testing (NDT) capability. To select a new system, we performed a thorough evaluation involving systems from most major X-ray and CT system vendors. Ultimately, the benchmark resulted in the purchase of a Nikon Metrology XT V 160 machine. We use the new system for critical measurement tasks and automated inspection jobs whereas the older system is still suitable for visual checks.”

Getting a grip on performance-critical aspects

The ability to literally look inside HID lamps is a great asset for Philips Lighting. X-rays penetrate the lamp and subsequently hit a 13×13-inch Varian flat panel, which generates radiography images with different shades of gray depending on material and geometry. On these translucent images, all the lamp’s constituent components are displayed in their entirety. The proprietary X-ray source incorporated into the system is equipped with a 1 micron transmission target. The XT V 160 is a high-precision imaging system that recognizes hidden features as tiny as 500nm, ideal for engineers to deduce structural, dimensional and connectivity related facts.

HID lamp electrodes are performance-critical components that undergo detailed X-ray research. Chris Dries explains that electrode characteristics influence the light the lamp produces by passing an electric arc through a compact tube filled with a high-pressure mixture of gases. “We measure the size and shape of electrodes contained in lamp prototypes as well as the distance between both electrodes. Inspect-X software allows us to automatically measure the distance between the electrodes’ tip planes. X-ray helps us a great deal in studying the way electrodes’ shape and structural characteristics evolve after every so many lighting hours. This is why Philips Lighting is able to successfully respond to the tight electrode requirements imposed on HID lamp engineering.”

NDT insight allows Philips toreduce the number of prototyping rounds and downscale life test activity.

X-ray proves technical facts that are indispensible in stretching the performance limits of lamps.

Chris Dries mentions that submicron image resolution provides great insight into other internal lamp phenomena, such as wall corrosion, glass frit, crazes and salt and mercury fillings. The XT V 160 system also supports the reconstruction of a CT volume, generated on the basis of hundreds of X-ray images. “By navigating CT volumes, we are able to locate and investigate crazes that may develop in ceramic discharge tubes. Similarly, we change position, angle and zoom as desired to take a close look at the otherwise invisible welds connecting electrodes with their supports. High image quality and magnification make it even possible to detect minuscule cavities in salt particles, something we were unable to do in the past.”

Automation and off-line inspection

To allow engineers to focus on their research and production work, most measuring tasks are delegated to system operators. They slide a tray with an array of lamps in the X-ray and CT system and start automatic data capture. The tray is indexed from one lamp to the next in order to subject all items to the same X-ray imaging routine. “Zoom level consistency and flux normalization maximize the repeatability of X-ray imaging, generating output that is truly operator independent,” says Dries. “This offers us the possibility to reliably set up macros for X-ray jobs that can run unattended at any time.”

All acquired imaging data can be sent to an offline station that runs Inspect-X software for inspection and macro preparation purposes. Engineers analyze X-ray graphics or navigate a CT volume to drill down on a particular detail, while having all relevant numerical information available at their fingertips. They value the fact that they can easily include X-ray shots and CT sections in their engineering reports.

Nearly all Olympic Game sports stadiums use Philips high-intensity discharge (HID) lamps.

Philips Turnhout produces HID lamps from 20 to 4000 Watt offering high light output and premium light quality.

Philips Lighting benefits from decades of experience in X-ray and CT system design, development and production that is present at Nikon Metrology. In addition to high-quality imaging, the system’s proprietary open-tube X-ray source is almost maintenance free compared with conventional closed-tube microfocus sources. Nikon Metrology is renowned for controlling all aspects of the technology, and in the unlikely case of failure, service engineers come on site and solve the problem.

A resolute choice for extended NDT

“The Nikon Metrology system is part of a strategic decision of Philips Lighting to make X-ray and CT an integral part of internal processes,” says Dries. “Angled views in highest resolution prove technical facts that are indispensible in stretching the performance limits of HID lamps. Important in this regard is studying the use of environmentally friendly materials and their impact on light, yield and reliability. With the insight gained, the number of prototyping rounds can be reduced and life test activity can be downscaled to some extent, saving both time and money. The resulting decrease in power consumption also contributes to greener economics. By extending NDT capabilities, Philips Lighting underlines its position of leading innovator and supplier of high-quality illumination solutions.”

Visit www.nikonmetrology.com for details.

Nikon Metrology NV Exhibits at Control Show 2011 in Stuttgart, Germany

 

Date	May 3-6, 2011
Booth	Hall 7 – Booth 7412
Location	Stuttgart, Germany
Hosted by	Nikon Metrology
Official website	http://www.control-messe.com/en/control

Come and see us at the Control Exhibition in Stuttgart

At the Control exhibition (Stuttgart, DE), Nikon Metrology features its entire product portfolio. Visitors are welcome to discover the new HN-6060 multi-sensor measuring system, learn about the complete portfolio of 3D laser scanners, explore latest CT technology, and much more. Large scale demonstrations include the recently launched Laser Radar MV330, iSpace and Adaptive Robot Control. In the microscope portfolio, the portable ShuttlePix is a new experience for analyzing samples in the field or in the lab.   
 
Nikon Metrology solutions on display:

• HN-6060 multi-sensor system for measuring intricate parts such as gears
• Ceramic LK CMMs equipped with high-performance LC60Dx and XC65D laser scanners and Focus software
• MCA II articulated measuring arms fitted with handheld digital MMDx and MMCx laser scanners
• Industrial XT H 225 and electronics XT V 130 inspection systems
• NEXIV VMR AND iNEXIV VMA vision inspection systems providing (sub)micron accuracy and inspection automation
• Dedicated microscope solutions such as ShuttlePix and NeoScope benchtop SEM
• A range of measuring microscopes and profile projectors
• Laser Radar and iGPS large-scale metrology, including Adaptive Robot Control
• Latest software releases on CAMIO, Focus, CMM-Manager 

 

HN-6060 multi-sensor  metrology system

CMM scanning  and  Feature inspection

Handheld scanning

X-ray and CT inspection

 

Vision systems and Microscopes

ShuttlePix

Laser Radar  & iSpace Large volume Metrology

Adaptive Robot Control

To obtain your free Nikon Metrology entrance ticket, please click here.

Cost-Effective 3D X-Ray Inspection

	Revolution X-ray inspection system. In the fast-moving and highly competitive electronics manufacturing market, long-term survival increasingly depends on developing relationships with customers and establishing a basis for repeat business. As a result, the ability to gain a reputation as a reliable and trustworthy supplier through the continual delivery of defect-free products has never been more important. Customers are also becoming increasingly price-sensitive, so gaining cost advantages through reduced waste while using competitively priced machinery is imperative. In response to this need, Nikon Metrology offers the XT V160 Inspection System, also known as the “Revolution.” A fundamental part of X-ray inspection is the ability to view a product from different angles. Further, identification of product defects depends on the magnification the inspection equipment can offer. And to increase the likelihood of identifying product defects, inspection images need to be of the highest possible resolution. Meeting all of these requirements, the smaller footprint and lower price micro-focus X-ray inspection system from Nikon Metrology provides the highest resolution and magnification possible within a compact system for quality control, research and failure analysis. With the ability to inspect substrates at steep angles of up to 75°, it is designed for 100 percent BGA and µBGA inspection, multilayer board inspection and PCB solder joint inspection in production lines and failure analysis laboratories in many manufacturing areas. True Concentric Imaging The XT V160 uses true concentric imaging that enables the operator to choose a Region of Interest (ROI) to inspect, which is then positioned in the center of the screen. To stay focused on this region, the X-ray source and detector rotate, rather than the product. The Region of Interest therefore remains completely locked into the center of the field of view under any combination of rotate, tilt and magnification, regardless of the sample’s position on the manipulator table. A further positioning feature is provided to view the region from any rotation (360° continuous freedom) and tilt angle of up to 75°. The XT V160 is therefore able to inspect around single or multiple BGA balls as the true concentric imaging feature operates over the entire scan area of the manipulator. Inspecting the rows of BGA balls is also less labor intensive than with standard manipulators as the XT V160’s true parallel tracking maintains the X and Y axes parallel to the BGA. This allows the rows to be scanned using a single X or Y axis instead of requiring the simultaneous operation of 3 axes. X-ray of ball-grid array. If a sample is to be declared defect-free, internal structures also require thorough inspection. The XT V160 employs Computed Tomography (CT) which is the process of imaging an object from many different directions using penetrating radiation and a computer to calculate the interior structure of that object from the images. Many industries make use of CT including electronics, aviation, medical, advanced materials research, casting and a host of other manufacturing areas. The CT function allows the complete structure of an object to be stored and examined to give a reading of all internal dimensions and the precise size, shape and location of any internal feature or defect. The CT system can be upgraded for real 3D analysis of components. The upgrade simply plugs into the existing manipulator controller without the need for future re-wiring or other modifications. Finding Product Defects Identification of product defects depends on the magnification the inspection equipment can offer. The transmission target design fitted to the XT V160’s X-Ray source has an ultra thin output window that enables samples to be safely placed within 250µ of the focal spot providing up to 13000x system magnification at all angles over the entire 410 x 410mm manipulator scan area. This facilitates 100 percent BGA, µBGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations. In addition, the patented Nikon Metrology Xi “Open Tube” X-ray source is smaller than any other design and allows X-ray images of fine detail in thick and dense samples to be seen with ease. This high energy vacuum de-mountable unit enables views at steep angles through solder joints and heatsinks without ever running out of energy. Another attribute of this technology is the combination of the vacuum tube and the voltage generator. This has resulted in increased reliability and reduced maintenance costs as the extra charges typically associated with servicing separate voltage generators, cables and connections are avoided. Inspecting PC board on sample tray. To increase the likelihood of identifying product defects, inspection images need to be of the highest possible resolution. The XT V160 employs a tightly controlled microfocus X-ray spot and the latest digital imaging technology including a NanoTech target capable of feature recognition to approximately 500nM. The advanced electromagnetic lens is computer-controlled to ensure that the image remains in focus at all kV settings and the target does not burn when using high power. This enables the production of sharp images of micron level features of even the most challenging substrates. Inspecting PC Boards The photography equipment incorporates a dual field image intensifier with a digital camera. This combination (Impix) provides a large field of view, high sensitivity and high dynamic range (16 bit image processing). Combined with the On Chip Integration (OCI) feature, this equipment allows the user to take advantage of low energy X-ray photons for imaging low density features such as aluminum bond wires, thin copper traces, epoxy voids and more. This is achieved by a very sensitive image intensifier and by gating the digital camera to accumulate a greater signal. The production of high resolution images is supported by Inspect-X, an advanced image capture and analysis software with special functions for inspection of semiconductor package voids, wire bonding and BGA solder bumps. Inspect-X runs under Windows XP Pro on the latest specification processing hardware which enables the resulting data to be saved or exported directly to any COM compliant package, such as MS Word, Excel, Access and SPC systems. A range of inkjet, laser or thermal printers can then be used to produce photo quality printouts. Inspect-X allows rapid software customization to suit specific inspection requirements and has been designed to enable quick transfer and sharing of information so that anyone can open and view the information from their PCs. CT reconstruction of ball-grid array. The need for user-friendly and flexible equipment in inspection requires common technology and platforms that are best suited for the purpose. The XT V160 is a versatile tool that allows an operator to easily make use of the system’s manual and programmable inspection capabilities. The Windows control screen is laid out logically with all regularly used functions in view on single click buttons. Joysticks are also provided for very fine positioning and control to enable a direct and logical response from both sample manipulator and X-ray images. This enables operators to pick up on even the most demanding defects. Inspection equipment should be designed for ease of use without compromising performance. To meet this need, the XT V160 provides advanced viewing capabilities including dual monitors that separate images from the software control and the Quad View that allows 4 images to be displayed at once. This process is useful for image comparison or reference for operators. The XT V160 is highly intuitive to operate and as a result, operator training time is significantly reduced. In addition, the XT V160 features advanced ergonomics including fully adjustable shelves that ensure all system controls are at the operator’s fingertips whether standing or sitting and irrespective of the person’s height. During the inspection process of the manufacturing line there is a high risk of samples being damaged by static as sample trays are often made of anodized aluminum which is not ESD safe. To ensure this is avoided, the XT V160 has a carbon fiber static dissipative sample tray with an ESD-safe side control desk and an additional ESD clip in point. With the ESD control desk there is no need to worry about placing a sample on a work desk and risk static damage.

Philips Lighting pushes innovation using Nikon Metrology X-ray and CT

Radiography imaging and metrology drives research, quality, productivity and a reduced ecological footprint

Philips Lighting in Turnhout, Belgium, recently took delivery of a Nikon Metrology XT V system for X-ray and computed tomography (CT) inspection. Engineers investigate electrodes and other parts of high-intensity discharge (HID) lamp prototypes, to push the boundaries of lamp performance, lifespan and ecological material usage. They inspect lamps from every angle, and repeat the inspections on the same units after extended lighting periods. Deeper insight into the progression of glass corrosion, component wear and deposit formation allows Philips Lighting to reduce extensive life testing, thus saving tremendously on energy costs.

A tradition of X-ray inspection carried forward

The Philips Lighting business division produces billions of bulbs a year. Philips Lighting kicked off X-ray inspection in 2003 to support the design-through-manufacturing process of high-intensity discharge (HID) lamps. The multinational’s division in Turnhout, Belgium, manufactures long-lasting HID lamps from 20 to 4000 Watts, offering high light output and premium light quality. These innovative illumination solutions raise comfort levels in offices, public buildings and factory halls; enhance traffic safety through street lights and passenger car headlights; and add entertainment value with flashy light shows to amp up rock stars’ performances.

Philips lighting decided to make X-ray and CT an integral part of its internal processes.

X-ray helps Philips Lighting to successfully respond to the tight electrode requirements imposed on HID lamp engineering.

“There is no doubt that X-ray inspection presents the best strategy to study the feasibility of new technologies, assemblies and materials and maintain high production quality,” says Chris Dries from Philips Innovative Applications in Turnhout. “For this reason we decided to further increase and sharpen our non-destructive testing (NDT) capability. To select a new system, we performed a thorough evaluation involving systems from most major X-ray and CT system vendors. Ultimately, the benchmark resulted in the purchase of a Nikon Metrology XT V 160 machine. We use the new system for critical measurement tasks and automated inspection jobs, whereas the older system is still suitable for visual checks.”

Getting a grip on performance-critical aspects

The ability to literally look inside HID lamps is a great asset for Philips Lighting. X-rays penetrate the lamp and subsequently hit a 13×13-inch Varian flat panel, which generates radiography images with different shades of gray depending on material and geometry. On these translucent images, all the lamp’s constituent components are displayed in their entirety. The proprietary X-ray source incorporated into the system is equipped with a 1 micron transmission target. The XT V 160 is a high-precision imaging system that recognizes hidden features as tiny as 500nm, ideal for engineers to deduce structural, dimensional and connectivity related facts.

HID lamp electrodes are performance-critical components that undergo detailed X-ray research. Chris Dries explains that electrode characteristics influence the light the lamp produces by passing an electric arc through a compact tube filled with a high-pressure mixture of gases. “We measure the size and shape of electrodes contained in lamp prototypes as well as the distance between both electrodes. Inspect-X software allows us to automatically measure the distance between the electrodes’ tip planes. X-ray helps us a great deal in studying the way electrodes’ shape and structural characteristics evolve after every so many lighting hours. This is why Philips Lighting is able to successfully respond to the tight electrode requirements imposed on HID lamp engineering.”

NDT insight allows Philips to reduce the number of prototyping rounds and downscale life test activity.

X-ray proves technical facts that are indispensible in stretching the performance limits of lamps.

Chris Dries mentions that submicron image resolution provides great insight into other internal lamp phenomena, such as wall corrosion, glass frit, crazes and salt and mercury fillings. The XT V 160 system also supports the reconstruction of a CT volume, generated on the basis of hundreds of X-ray images. “By navigating CT volumes, we are able to locate and investigate crazes that may develop in ceramic discharge tubes. Similarly, we change position, angle and zoom as desired to take a close look at the otherwise invisible welds connecting electrodes with their supports. High image quality and magnification even make it possible to detect minuscule cavities in salt particles, something we were unable to do in the past.”

Automation and off-line inspection

To allow engineers to focus on their research and production work, most measuring tasks are delegated to system operators. They slide a tray with an array of lamps in the X-ray and CT system and start automatic data capture. The tray is indexed from one lamp to the next in order to subject all items to the same X-ray imaging routine. “Zoom level consistency and flux normalization maximize the repeatability of X-ray imaging, generating output that is truly operator-independent,” says Dries. “This offers us the abililty to reliably set up macros for X-ray jobs that can run unattended at any time.”

All acquired imaging data can be sent to an offline station that runs Inspect-X software for inspection and macro preparation purposes. Engineers analyze X-ray graphics or navigate a CT volume to drill down on a particular detail, while having all relevant numerical information available at their fingertips. They value the fact that they can easily include X-ray shots and CT sections in their engineering reports.

Nearly all Olympic Game sports stadiums use Philips high-intensity discharge (HID) lamps.

A resolute choice for extended NDT

“The Nikon Metrology system is part of a strategic decision by Philips Lighting to make X-ray and CT an integral part of internal processes,” says Dries. “Angled views in highest resolution prove technical facts that are indispensible in stretching the performance limits of HID lamps. Important in this regard is studying the use of environmentally friendly materials and their impact on light, yield and reliability. With the insight gained, the number of prototyping rounds can be reduced and life test activity can be downscaled to some extent, saving both time and money. The resulting decrease in power consumption also contributes to greener economics. By extending NDT capabilities, Philips Lighting underlines its position of leading innovator and supplier of high-quality illumination solutions.”

Nikon Metrology Exhibits at ISTFA 2010 in Dallas

ISTFA – International Symposium for Testing and Failure Analysis

Nikon Metrology, Inc
Booth#118
Dallas, TX
Intercontinental Hotel Dallas
November 16-17, 2010

Nikon Metrology will be featuring a wide variety of x-ray and CT inspection solutions at this event.

Enrich your career at the 36^th International Symposium for Testing and Failure Analysis, November 14-18 in Dallas, Texas. Acquire the latest knowledge from the field’s leading professionals with six days of tutorials, short courses, technical presentations, panels, and user groups. Research leading edge instruments and solutions at the industry’s largest dedicated equipment expo. Meet and network with hundreds of your peers from novice to expert.

 http://asmcommunity.asminternational.org/content/Events/istfa/registration.jsp

Visit www.NikonMetrology.com to learn more about X-ray and CT inspection.

X-ray of Ball Grid Array

Nikon Metrology Exhibits at ASNT 2010

ASNT Fall Conference and Quality Testing Show

Nikon Metrology, Inc
Booth#239
Houston, TX
Houston Convention Center
November 15-17, 2010

Nikon Metrology will be featuring a wide variety of x-ray and CT inspection solutions at this event.

Houston is It for the 2010 ASNT Fall Conference and Quality Testing Show. Houston is the perfect setting for the world’s largest annual gathering of NDT professionals who come together to learn, exchange, network, and engage; this is where NDT business gets done.

http://www.asnt.org/events/calevents/calevents.htm

Learn more about X-ray and CT Inspection. Visit www.NikonMetrology.com.

X-ray system traces failures inside electronic devices

Nikon Metrology’s compact XT V 130 X-ray inspection system traces failures inside complex electronic devices and multilayer circuit boards. Hidden electronic defects arisen during production or assembly generally result in system failure, fabrication delay and additional cost. These defects can be detected efficiently early on in the process by taking an in-depth look at the inside of electronic specimens.

Designed for high-throughput electronics X-ray inspection, the XT V 130 is a  QA workhorse that allows operators to provide instant pass/fail status. Automated inspection functions and (optional) automatic board identification ensure high inspection throughput rates. Inspection reports compliant with MRP systems facilitate tight integration into customers’ manufacturing processes.

Today, any OEM and subsystem supplier of consumer, automotive, aerospace, medical and electronics can take advantage of X-ray inspection technology to get the job done!

The system comes with a 30-130kV open micro-focus X-ray source, a 4-axis programmable manipulator and a 16-bit imaging system based on a 4” image intensifier. With a focal spot size down to 3 microns, 320x geometric magnification and tilt angle up to 60°, the XT V 130 offers excellent image quality and flexibility. A rotating stage and CT capability are available as options. A hinged door provides easy access to the inspection area, which fits samples up to 16″ x14″.

Using qualitative real-time X-ray capabilities, operators intuitively navigate through the layers of a PCB or inside electronic devices, by changing position, angle and zoom as desired using the joystick. The XT V 130 system is ideally suited to quickly trace material inconsistencies, connectivity issues, incomplete through-layer vias and other failures.

The intuitive operation of the compact XT V 130 system is controlled by Inspect-X, the powerful proprietary software used on all Nikon Metrology XT systems. Inspect-X is known for its powerful X-ray image processing and analysis as well as the broad set of automation capabilities that is included. Developed to streamline the inspection process with ultrafast x-ray acquisition, the XT V 130 runs first-article inspection in minutes, instead of hours or days.

With a  footprint of just 1m2, a built-in generator and weight below 1150kg, the XT V 130 system easily fits any electronics production area without requiring high-voltage power or special floor conditions. The system’s protective enclosure puts safety first, avoiding the use of dedicated badges or protective clothing.

What makes a 300-year-old watch tick?

Article By Jo Marchant

State-of-the-art X-ray scans have revealed the internal mechanisms of a corroded, barnacle-covered pocket watch recovered from a seventeenth-century wreck. The watch looks little more than a lump of rock from the outside, but the scans show that the mechanism inside is beautifully preserved, from delicate cogwheels and Egyptian-style pillars to the maker’s inscription.

Researchers from the National Museums Scotland in Edinburgh used the images to construct a three-dimensional

Stunning details of the internal mechanism of a salvaged pocket watch have been revealed by cutting-edge X-ray analysis. Trustees of NMS

virtual reconstruction of the watch’s lost workings. They hope to use the technique to probe the internal structure of other archaeological artefacts, especially those salvaged from underwater sites. The watch and three-dimensional reconstruction are now on display in the Treasured exhibition of the National Museum of Scotland until 2011.

The watch was found on a wreck believed to be the Swan — a small warship that sank off the west coast of Scotland during the English Civil War. She formed part of Oliver Cromwell’s forces that attacked the Royalist stronghold of Duart Castle in Mull, UK, but succumbed to a violent gale on 13 September 1653.

A naval diver discovered the wreck in the 1970s, and it was excavated in the 1990s. Salvaged artefacts including the pocket watch, a hoard of silver coins, cast iron guns and an ornate sword hilt were taken to the National Museum of Scotland.

Rusty remnants

The watch itself was barely recognisable. Conventional X-ray images taken at the museum showed cogwheels inside, but didn’t provide any useful information about the workings of the watch, or how well it was preserved.

Museum researchers Lore Troalen, Darren Cox and Theo Skinner saw a paper in Nature that described how X-ray computed tomography (CT) had been used to image an ancient Greek device called the Antikythera Mechanism1. This artefact had also been salvaged from a shipwreck.

CT involves taking a series of slices through an object at different angles, and combining them using a computer to produce a three-dimensional reconstruction of the object’s internal structure. Andrew Ramsey and his colleagues at the company X-Tek Systems in Tring, Hertfordshire, UK, had developed an improved CT technique using small yet high-voltage X-ray sources, which enabled them to obtain very high-resolution images, even when penetrating dense metal.

Troalen and Cox took the Swan watch to X-Tek (now owned by Nikon), and the resulting images taken by Ramsey and his colleagues have a resolution of 63 micrometres2 and show that much of the mechanism inside the watch is perfectly preserved ( see slideshow ).

Any parts made of steel, including the watch’s single hand as well as the studs and pins that originally held the mechanism together, have corroded away. But most of the components are brass, and in excellent condition. “The results surpassed all of our expectations,” says Troalen. “We never thought that so much of the mechanism would have survived.”

Detailed dream

The resulting reconstruction of the watch shows plenty of decorative touches and exquisite attention to detail. The top and bottom plates are held together by square-section Egyptian tapered pillars, first used around 1640. Other parts of the mechanism are engraved with a floral design. The clockface itself is marked in Roman numerals with what appears to be a fleur de lys on each half-hour, and an English rose in the centre.

The researchers even found the maker’s name. An engraving on the watch’s top plate reads “Niccholas Higginson of Westminster”. Clockmakers’ directories attest that Higginson was making watches in Chancery Lane and in Westminster, London, in the years before the Swan went down.

Colin Martin, a retired maritime archaeologist who was at the University of St Andrews in Fife, UK, and led the original excavation of the Swan, describes the work as “brilliant”. “We know more about the thing than we would have done if we had taken a hammer to it,” he says. “And the object is still intact.”

This study and the imaging of the Antikythera Mechanism show the level of detail that can be preserved inside objects even after hundreds or thousands of years under water, and demonstrates the potential of CT for probing artefacts that are encased within layers of corrosion products. For imaging small-scale structures such as inscriptions and mechanical components, “it’s a dream,” says Cox. The researchers now hope to scan a door lock from the Swan.

Read more about various CT techniques and capabilities.

Visit Nikon Metrology at IMTS 2010 – Booth #E-5325 and #N-6260

Booth #E-5325 will be featuring Nikon Metrology’s wide range of metrology solutions including: CMMs with both touch probe and 3D laser scanning capabilities, video measuring systems, Industrial microscopes, portable CMM arms with both touch probe and 3D scanning capabilities, X-ray and CT inspection systems and the latest in metrology software.

Nikon Metrology has a second booth at the IMTS show this year. Booth #N-6260, located in the North exhibit hall, will be featuring two of our large scale metrology solutions including our Adaptive Robot Control (ARC) and our K-Series Optical CMM.

Visit www.NikonMetrology.com for more details or email marketing_us@nikonmetrology.com to set up a product demonstration at the show.

NGI uses CT inspection to research soil and rock samples

Recently, Nikon Metrology installed an XT H system at NGI – Norwegian Geotechnical Institute – an internationally leading center for geosciences research and consulting. NGI researchers use this high-performance industrial computed tomography (CT) scanner to run in-depth non-destructive investigation of large rock and soil samples. Voids, inclusions and disturbances in soil samples are key characteristics when investigating stability issues in the design and construction phases of large infrastructure, such as buildings, pipelines and offshore platforms.

CT scanning serves a wide application spectrum
Companies and public authorities seek NGI expertise on the design and construction of infrastructure to obtain maximum stability on local soil structure and rock formations. NGI assists the oil, gas and energy industries with expertise regarding exploration, development and operation of offshore fields. Soil geotechnical expertise also supports international building and construction markets.

CT scanning results will complement the characterization of geological heterogeneities and fractures in rocks. By monitoring aspects like evolution of fractures and fluid flow inside rock samples, the stability and operation of reservoirs and wells can be addressed.

“To closely examine samples of soil and rock in the laboratory, we chose the industrial Nikon Metrology XT H225 CT system,” explains Magnus Soldal, laboratory technician at NGI headquarters in Oslo, Norway. “The purchase of this premium equipment fits with our strategy to acquire as much information as possible on expensive onshore and offshore rock and soil samples using non-destructive inspection technologies. Our choice for Nikon Metrology was based on the system’s fine image resolution along with the optional convertible roof and extra-large cabinet that allow additional instrumentation to be placed inside the machine.”

Capturing dynamic tests at high image resolution
Cylindrical rock and soil samples in plastic or metal tubes come in different sizes. They typically have diameters between 50 – 150 mm and lengths up to 1 meter. Magnus Soldal says that for the longer samples, the system is equipped to move the rotating sample up or down to subject different parts of the sample to three-dimensional CT scanning. “For the smaller samples, the plan is to be able to use the CT scanner in combination with a triaxial loading cell to monitor the evolution of fractures and fluid flow”.

“For large soil samples as well as detailed rock investigations, the intrinsic image quality of the Nikon Metrology XT H system is impressive,” states Magnus Soldal. “We opted for a panel detector that features a larger size and higher image resolution. This is particularly important when performing detailed investigations of inhomogeneous sample sections and areas that can only be detected through CT scanning. Voids, inclusions and fracture planes are key features when characterizing the sample. On the basis of the inspection results, we pick the sample sections that will be subjected to geotechnical testing for stability evaluation.”

A truly safe system requiring limited training
Magnus Soldal testifies that inspection times are relatively short. “On average, detailed rock samples take approximately 30 minutes for X-ray and 15 minutes to generate the three-dimensional CT reconstruction of the sample. The inspection of offshore clay or other larger samples go faster, as less attention is given to the reconstruction of 3D volumes.” After calibrating the relation between material density and image grey scales, NGI researchers will be able to map various types of features and materials in the rock and assess their importance.

Overall, NGI operators perceive the use of the XT H system as fairly straightforward. “To be able to activate the optimum settings for a particular inspection task, we received three days of training, with two more to follow shortly. In addition to intuitive system operation, the Nikon Metrology CT scanner is an instrument that can be installed without requiring special floor conditions. Even more important is operator safety with regard to radiation. Although the system already met strict safety standards, we had its radiation measured here in Norway, confirming the excellent safety status of the equipment.”

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Dimensions in Medical Metrology

From optical comparators to computed tomography, metrology equipment is adapting to aid advances in medical manufacturing

Medical devices extend life or make living more comfortable. Driven by advances in machining, new devices are getting smaller and more complicated. Other devices, while not getting smaller, are increasing in demand, meaning production volumes are increasing. From looking into parts more deeply, combining sensors for more complete coverage, or speeding up processes in time, metrology equipment is improving in many dimensions for medical devices. This includes optical comparators, video metrology systems, CMMs, touch probes, and laser scanners. Even metrologygrade X-ray Computed Tomography (CT) is now offered. Each sensor has limitations and strengths.

CT Scan of Lizard Skull

In this Medical Manufacturing Magazine, x-ray and CT expert David Bate from Nikon Metrology talks about the various solutions that Computed Tomography (CT) machines have provided to the medical manufacturing industry.

Click here to read this entire article.