Nikon Metrology Presents the Premium, Portable CMM – MCAx articulated arm with MMDx Laser Scanner

Check out Nikon Metrology’s newest addition to our portable CMM family! Click below to view a video of our MCAx with our MMDx laser scanner in action!

For more details on this new portable arm, visit www.NikonMetrology.com.

Nikon Metrology Exhibits at MFG4 2012

NIKON METROLOGY BOOTH #1101

At MFG4 2012, located in Hartford, CT this year May 8-10, Nikon Metrology will feature our LK CMM with the new LC15Dx Digital Line Scanner, the iNexiv VMA-2520 Vision Measuring System, the Laser Radar for large volume metrology, the  ShuttlePix Digital Handheld Microscope, the Portable Measuring Arm with MMDx scanner, and the SMZ Zoom Stereomicroscope.

Please contact us for more information on any one of these products. Or, to set up a demonstration at the show, click here.  

Nikon Metrology Exhibits at Eastec 2011

At Eastec this year, Nikon Metrology will feature the most complete and innovative metrology product portfolio, including:

 

 

The ShuttlePix P-400R is based on a new shuttle concept allowing much easier remote inspection for samples, an idea which originally was considered to be too difficult for large scale products. This will allow not only Industrial applications to be the target but also an effective solution for many other practical, imaging problems.

The iNEXIV VMA-2520 is a new multi-sensor measuring system that’s lightweight and compact enough to be used in the factory on the bench top, with fast, fully automatic and high accuracy features that make it ideally suited for a wide variety of industrial measuring, inspection and quality control applications.

 

K-Series cameras measure the position of infrared LEDs by means of linear CCD cameras. Through triangulation, the 3D position of each LED is calculated. 9 LEDs are built into the handheld SpaceProbe, an ergonomically designed device that enables an inspector to measure the actual 3D data of an inspection part in single point or scanning mode. The optical measuring CMMs are available in a portable and a mobile configuration.

 

The MCA II, Manual Coordinate measuring Arm, is a precise, reliable and comfortable portable measuring system available in a 6- or 7-axis version. It feels perfectly at home in the metrology lab as well as on the shop floor.

The MCA II can be equipped with a wide range of probing systems for laser scanning, touch trigger measurements and continuous scanning. Its flexibility makes this measurement arm the perfect partner for a wide range of measurement tasks.

For the latest in metrology, visit booth #3135 first!

Contact us today to set up a demo at the show.

Visit www.nikonmetrology.com for more details.

Nikon Metrology NV Exhibits at Control Show 2011 in Stuttgart, Germany

 

Date	May 3-6, 2011
Booth	Hall 7 – Booth 7412
Location	Stuttgart, Germany
Hosted by	Nikon Metrology
Official website	http://www.control-messe.com/en/control

Come and see us at the Control Exhibition in Stuttgart

At the Control exhibition (Stuttgart, DE), Nikon Metrology features its entire product portfolio. Visitors are welcome to discover the new HN-6060 multi-sensor measuring system, learn about the complete portfolio of 3D laser scanners, explore latest CT technology, and much more. Large scale demonstrations include the recently launched Laser Radar MV330, iSpace and Adaptive Robot Control. In the microscope portfolio, the portable ShuttlePix is a new experience for analyzing samples in the field or in the lab.   
 
Nikon Metrology solutions on display:

• HN-6060 multi-sensor system for measuring intricate parts such as gears
• Ceramic LK CMMs equipped with high-performance LC60Dx and XC65D laser scanners and Focus software
• MCA II articulated measuring arms fitted with handheld digital MMDx and MMCx laser scanners
• Industrial XT H 225 and electronics XT V 130 inspection systems
• NEXIV VMR AND iNEXIV VMA vision inspection systems providing (sub)micron accuracy and inspection automation
• Dedicated microscope solutions such as ShuttlePix and NeoScope benchtop SEM
• A range of measuring microscopes and profile projectors
• Laser Radar and iGPS large-scale metrology, including Adaptive Robot Control
• Latest software releases on CAMIO, Focus, CMM-Manager 

 

HN-6060 multi-sensor  metrology system

CMM scanning  and  Feature inspection

Handheld scanning

X-ray and CT inspection

 

Vision systems and Microscopes

ShuttlePix

Laser Radar  & iSpace Large volume Metrology

Adaptive Robot Control

To obtain your free Nikon Metrology entrance ticket, please click here.

Nikon Metrology Exhibits at the AERODEF Manufacturing Show 2011

 

At AERODEF this year, Nikon Metrology will feature the most complete and innovative metrology product portfolio, including:

 

The ShuttlePix P-400R is based on a new shuttle concept allowing much easier remote inspection for samples, an idea which originally was considered to be too difficult for large scale products. This will allow not only Industrial applications to be the target but also an effective solution for many other practical, imaging problems.

The Laser Radar offers non-contact inspection with automated operation. It incorporates patented laser reflection technology for direct surface and feature measurement at high data rates. As a result, Laser Radar eliminates the tedious use of photogrammetry targets, SMRs or handheld probes, slashing inspection time and operator overhead. Laser Radar is able to scan dark diffuse, highly reflective or delicate surfaces  at challenging incident angles. Unmatched by any other metrology system, Laser Radar combines non-contact, targetless, long range and high accuracy inspection on any material.

The MCA II, Manual Coordinate measuring Arm, is a precise, reliable and comfortable portable measuring system available in a 6- or 7-axis version. It feels perfectly at home in the metrology lab as well as on the shop floor.

The  MCA II  can  be  equipped  with  a  wide  range of  probing systems  for laser scanning, touch  trigger measurements and  continuous scanning. Its flexibility makes this measurement arm the perfect partner for a wide range of measurement tasks. 

Visit www.nikonmetrology.com for more details.

We hope to see you at the show!

Contact us today to set up a demo at the show.

Visit Nikon Metrology at IMTS 2010 – Booth #E-5325 and #N-6260

Booth #E-5325 will be featuring Nikon Metrology’s wide range of metrology solutions including: CMMs with both touch probe and 3D laser scanning capabilities, video measuring systems, Industrial microscopes, portable CMM arms with both touch probe and 3D scanning capabilities, X-ray and CT inspection systems and the latest in metrology software.

Nikon Metrology has a second booth at the IMTS show this year. Booth #N-6260, located in the North exhibit hall, will be featuring two of our large scale metrology solutions including our Adaptive Robot Control (ARC) and our K-Series Optical CMM.

Visit www.NikonMetrology.com for more details or email marketing_us@nikonmetrology.com to set up a product demonstration at the show.

Nikon Metrology and Verisurf team up to increase manufacturing efficiency

Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series optical CMMs configured with scanners and probes, MCA II articulated arm configured with scanners and probes, and the iGPS.

“Verisurf is proud to partner with Nikon Metrology and offer engineers a major breakthrough in measurement and inspection,” said Ernie Husted, president of Verisurf. “Having advanced inspection software that can be used with all of their metrology devices will dramatically increase efficiency. Manufacturers will save countless hours otherwise spent learning and using multiple software interfaces, while significantly reducing software maintenance and technical support costs.”

“This partnership is a huge benefit to our metrology customers,” said Doug Kappler, Director of Nikon Metrology Large Scale Division. “In addition to being able to offer a single software platform for all Nikon Metrology portable metrology devices, the software provides fully automated and programmable measurements.” We hope customers of Verisurf will stop and see how this partnership with Nikon Metrology provides world-class products for the everyday user. 

Verisurf’s new X platform is the latest release of its popular computer-aided inspection and reverse engineering software. The X platform gives engineers unprecedented value with new device interfaces, improved inspection guidance functionality and feature extraction for reverse engineering. An updated VDI has added many new non-contact measurement and automation controls for the Nikon Metrology Laser Radar, enabling this sophisticated metrology device to perform at its highest level.

Nikon Metrology and Verisurf exhibited the solution at the Coordinate Metrology Systems Conference (CMSC) in Reno from July 13-15.

 

Verisurf Software, Inc.

Verisurf Software, Inc. is a privately held metrology software development company committed to delivering advanced computer-aided inspection and reverse engineering solutions. Verisurf software lets manufacturers produce higher quality products in less time and at a lower cost by using highly automated paperless, 3D model-based inspection processes, rather than hand measurements and 2D paper drawings. For more information, visit www.verisurf.com.

Click here for more details