Another Successful IMTS for Nikon Metrology

NIKON METROLOGY BOOTH #E-5371

Marrying the power of X-RAY/CT with Certified METROLOGY…

Nikon Metrology introduced the MCT225, offering absolute accuracy for inside geometry. This new ‘absolute-accuracy’ Metrology-CT (MCT) system measures all internal and external geometry efficiently in a single non-destructive process. Since you visited our booth, we hope you were able to experience this newest product from Nikon Metrology’s broad range of Metrology Solutions.

SCANNING ELECTRON MICROSCOPY AS EASY TO USE AS A DIGITAL CAMERA…

The JCM-6000 NeoScope, a powerful benchtop Scanning Electron Microscope that is a high resolution SEM, producing images with a large depth of field at magnifications ranging from 10X – 60,000X. It combines the familiar look and feel of today’s smart phones and tablets with simple operation, enhanced low vacuum capability, and New Imaging Capabilities.  And it is compact, lightweight, and energy efficient!

THE METROLOGY SOLUTIONS DON’T STOP THERE!

Nikon Metrology also featured our iNexiv VMA-2520 Vision Measuring System, the  ShuttlePix Digital Handheld Microscope, the SMZ Zoom Stereomicroscope, our Laser Radar for large volume applications, Coordinate Measuring Machines with our newest LC15Dx digital laser scanning and touch probe technology and if you toured our booth, you also noticed our newest Portable Metrology Arm, the MCAx!

 

Visit http://www.nikonmetrology.com/ for more details!

 

Hoskin Scientific Features Nikon Metrology Solutions at Canadian Manufacturing Week – Booth # 5022

October 5-7, 2010
Toronto Congress Centre, North Building
650 Dixon Road
Toronto, Ontario, Canada

Canada’s LARGEST and MOST COMPREHENSIVE MANUFACTURING SHOW is back and packed with MORE NEW TECHNOLOGIES than ever before!

Canadian Manufacturing Week (CMW), is the event that Canadian manufacturers have relied on for over 20 years to improve and strengthen their business. The show you look to for innovative products, technology, equipment and services has evolved into something even better. A new, state-of-the-art venue, convenient location, and more new technologies than ever before combines to form the most efficient and effective way to source the solutions you need to succeed – all under one roof.

  

 

 

 

 

 

 

Hoskin Scientific will be exhibiting at CMW 2010, Booth#5022. In their booth they will feature the Nikon Metrology 6-axis portable arm with touch probe and CMM-Manager software as well as the SMZ-745T stereoscopic microscope.

Visit http://www.hoskin.ca/ for more information or visit http://us.nikonmetrology.com/ to learn more about our products.