The Coordinate Metrology Society (CMS), the preeminent membership association for measurement professionals, announces the “Call for Papers” for the 2010 Coordinate Metrology Systems Conference (CMSC). This annual event will be held in Reno, Nevada from July 12 – 16, 2010. Metrology users are invited to submit abstracts for presentations and technical white papers detailing their successful application of 3D coordinate measurement systems. For more than 25 years, the CMSC has hosted the highest caliber of expert presentations that explore technology, theory, and practice to advance the field of 3D coordinate metrology.
Once again, Nikon Metrology will be attending and exhibiting at this conference and invites our industry contacts to submit abstracts for technical presentations.
Abstract submissions will be peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2010. The deadline for abstracts is April 16, 2010.
In 2009, more than 20 expert presentations were delivered by industry leaders from NASA Goddard Space Center, Airbus, Audi, The Boeing Company, University of Michigan, Spirit AeroSystems, Lockheed Martin MFC – Dallas, National Research Council Canada, University of Warwick, and other professionals in the field of metrology. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor. Each year, the CMS community convenes to exchange information and attend white paper presentations delivered by their peers.
A diverse range of topics, applications, and industry best practices were presented at CMSC 2009, from the precise alignment and positioning of a large Spectroscopic Telescope, to the measurement of the USS Monitor’s Dahlgren gun, to geometry inspection of precision-forged crank shafts, to measurement-assisted assembly of large volume aircraft wing structures.
CMSC is attended by users, service providers, and OEM manufacturers of close-tolerance, portable industrial coordinate measurement systems, software, and peripherals. Attendees hail from prominent science/research laboratories, and diverse industries such as aerospace, space hardware, antenna, automotive, shipbuilding, power generation, and general engineering.
About the Coordinate Metrology Society (CMS)
The CMS is a society of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The metrology systems utilized by industry and represented at their annual CMSC conference include laser projection systems, laser trackers, laser radars, photogrammetry/ videogrammetry systems, scanners, and indoor GPS. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information on the Coordinate Metrology Society and how to join the organization, visit their web site at http://www.cmsc.org.
About the Coordinate Metrology Systems Conference (CMSC)
The Coordinate Metrology Systems Conference (CMSC) is the world’s premier event for Measurement Technology Professionals. This annual event is sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC is renowned for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and manufacturing industries such as aerospace, space hardware, antenna, automotive, shipbuilding, power generation, and general engineering. No other conference or trade show rivals the high level of authoritative information provided by CMSC master users of portable instrumentation and inspection software for quality control, quality production, and precision assembly.
For more details, visit the CMSC website.
*The content for this blog entry was supplied by the CMSC committee.
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